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Provides a high throughput solution for wafer level parametric testing
Up to 24 sets of input channels (Triax Force-Sense connections)
48 output Pogo pin connections in a contact ring
Low leakage (PCB construction, Reed relay, fully guarded and isolated signal design)
GPIB(SCPI), RS232, USB and Ethernet ready
Adaptable to all automated wafer probers
Compatible with all parametric testers.
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