The QualiTau product line now includes the MIRA, Infinity, ACE, and Multi-Site Probe System as well as Test Lab Services. The systems offer various solutions for both package and wafer level testing of a Device Under Test (DUT), usually a specifically designed test structure, for Electromigration (EM), Time Dependant Dielectric Breakdown (TDDB), and Hot Carrier (HC) effects as well as a variety of related applications.

ReliabilityReliability Test Systems

ParametricParametric and Reliability Solutions

Test Lab ServicesPackage and Wafer Level Reliability Test Services